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Reflection from Si3N4

Description: Photograph of a reflection from Si3N4 (silicon nitride) taken under a focused ion beam (FIB) microscope.
Date: November 9, 2005
Creator: University of North Texas. Center for Media Production.
Location: 33.254084 -97.153583
Partner: UNT Libraries Special Collections

[Tracey takes photograph in CMP studio]

Description: Photograph of Center for Media Production (CMP) staff member Tracey taking a photograph in a studio on the UNT campus. Tracey is facing to the left, looking into the viewfinder of a camera. She is adjusting the focus of the camera with her left hand. A portrait backdrop and a lighting umbrella can be seen in the background of the photograph.
Date: June 9, 2000
Creator: University of North Texas. Center for Media Production.
Location: 33.207488 -97.152586
Partner: UNT Libraries Special Collections

Surface

Description: Photograph of a scan taken by a focused ion beam (FIB) microscope. The scan shows a large group of thin, elongated forms connected to an irregular surface.
Date: November 9, 2005
Creator: University of North Texas. Center for Media Production.
Location: 33.254084 -97.153583
Partner: UNT Libraries Special Collections
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